中图分类号：TN03 文献标志码：A DOI: 10.16157/j.issn.0258-7998.268410
中文引用格式： 高仕达，姜华，李璠，等. PIM测试用碳化硅吸波尖锥设计与吸波箱研制方案[J]. 电子技术应用，2026，52(10)：95-99.
英文引用格式： Gao Shida，Jiang Hua，Li Fan，et al. Silicon carbide pyramid absorber design and absorbing chamber development for PIM testing[J]. Application of Electronic Technique，2026，52(10)：95-99.

Silicon carbide pyramid absorber design and absorbing chamber development for PIM testing

Abstract： To further enhance the testing capabilities of the passive intermodulation (PIM) testing system and ensure the successful completion of key tasks in the field of communication satellites, this study aims to effectively utilize the characteristics of silicon carbide (SiC) absorbing materials, such as their high- and low-temperature resistance, high-power endurance, and low PIM performance, and convert these properties into experimental equipment suitable for ground verification of aerospace equipment. This paper proposes a novel pyramid absorber configuration specifically designed for PIM testing. It elaborates on the absorption mechanism of silicon carbide pyramid absorbers and provides optimization principles and configuration parameters for existing silicon carbide pyramid absorbers. Based on this foundation, the study presents a manufacturing scheme for a high- and low-temperature PIM test absorbing chamber using the optimized silicon carbide pyramid absorbers. Additionally, the paper provides the experimental results for the validation of the absorbing chamber's capabilities, demonstrating its temperature endurance in PIM testing across a range of -70 ℃ to +150 ℃.

Key words : passive intermodulation；silicon carbide pyramid absorber；high-and low-temperature resistance；absorbing chamber